Original Article
  • Prediction of the Warpage for Large-scale Semiconductor Package Using Equivalent Model Considering the Anisotropic Thermomechanical Properties Based on Multi-physics Simulation
  • Woong-Kyoo Yoo*, Jeong-Hyeon Baek*, Jong-Whi Park*, Hak-Sung Kim*,**†

  • * Department of Mechanical Convergence Engineering, Hanyang University, Seoul, Republic of Korea
    ** Hanyang Research Center for Advanced Semiconductor Packaging, Hanyang University

  • 다중 물리 시뮬레이션 기반 이방성 열-기계적 특성을 고려한 등가 모델링 활용 대면적 반도체 패키지의 워피지 예측
  • 유웅규* · 백정현* · 박종휘* · 김학성*,**†

  • This article is an open access article distributed under the terms of the Creative Commons Attribution Non-Commercial License (http://creativecommons.org/licenses/by-nc/4.0) which permits unrestricted non-commercial use, distribution, and reproduction in any medium, provided the original work is properly cited.

References
  • 1. C.-T. Ko, and K.-N. Chen, “Reliability of key technologies in 3D integration,” Microelectronics Reliability, Vol. 53, No. 1, pp. 7-16, 2013.
  •  
  • 2. X. Dai, Y. Wang, Y. Wu, H. Luo, G. Liu, D. Li, and S. Jones, “Reliability design of direct liquid cooled power semiconductor module for hybrid and electric vehicles,” Microelectronics Reliability, Vol. 64, pp. 474-478, 2016.
  •  
  • 3. A. Ahmad, “Automotive semiconductor industry-trends, safety and security challenges,” 2020, pp. 1373-1377.
  •  
  • 4. J. Meza, T. Xu, K. Veeraraghavan, and O. Mutlu, “A large scale study of data center network reliability,” 2018, pp. 393-407.
  •  
  • 5. J. McPherson, “Brief history of JEDEC qualification standards for silicon technology and their applicability (?) to WBG semiconductors,” 2018, pp. 3B. 1-1-3B. 1-8.
  •  
  • 6. J. Canny, “A computational approach to edge detection,” IEEE Transactions on Pattern Analysis and Machine Intelligence, No. 6, pp. 679-698, 1986.
  •  
  • 7. N. Dalal and B. Triggs, “Histograms of oriented gradients for human detection,” 2005, pp. 886-893.
  •  
  • 8. S.-J. Joo, B. Park, D.-H. Kim, D.O. Kwak, J. Park, and H.S. Kim, “Bi-directional homogenization equivalent modeling for the prediction of thermo-mechanical properties of a multi-layered printed circuit board (PCB),” Journal of Micromechanics and Microengineering, Vol. 26, No. 4, pp. 045006, 2016.
  •  

This Article

Correspondence to

  • Hak-Sung Kim
  • * Department of Mechanical Convergence Engineering, Hanyang University, Seoul, Republic of Korea
    ** Hanyang Research Center for Advanced Semiconductor Packaging, Hanyang University

  • E-mail: kima@hanyang.ac.kr